Data for Atomic Resolution Convergent Beam Electron Diffraction Analysis Using Convolutional Neural Networks

Zhang, Chenyu; Feng, Jie; Rangel DaCosta, Luis; Voyles, Paul M.

simulation experiment machine learning microscopy 4D STEM CBED PACBED CNN neural network

Organizations

MDF Open

Year

2019

Source Name

zhang_atomic_resolution_networks

License

CC-BY 4.0

Contacts

Paul Voyles

DOI

10.18126/4nm2-0g70 View on Datacite

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Simulated and experimental 4D STEM data sets acquired from SrTiO3 [100] as a function of thickness. Convolutional neural networks trained to determine the sample thickness from 4D STEM data.