Data for "Denoising Atomic Resolution 4D Scanning Transmission Electron Microscopy Data with Tensor Singular Value Decomposition"

Zhang, Chenyu; Han, Rungang; Zhang, Anru; Voyles, Paul M.

simulation experiment machine learning semiconductors oxides microscopy 4D STEM denoising component analysis tensor SVD

Organizations

MDF Open

Year

2020

Source Name

zhang_tensorsvd_4dstem

License

CC-BY 4.0

Contacts

Paul Voyles

DOI

10.18126/vh9q-i1l6 View on Datacite

Get the Data

Data for "Denoising Atomic Resolution 4D Scanning Transmission Electron Microscopy Data with Tensor Singular Value Decomposition" by Chenyu Zhang, Rungang Han, Anru R. Zhang, Paul. M. Voyles. Consists of experimental and simulated 4D STEM data both as-created and after denoising with tensor singular value decomposition. Simulated data sets are from SrTiO3 [100] and an edge dislocation in Si [110]. Experimental data sets are from SrTiO3 [100] and an epitaxial LiZnSb thin film on GaSb substrate. MATLAB code for tensor SVD denoising is also included.